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Determining optical properties of thin films by modified attenuated total reflection with a charge coupled device

Citation

Wilson, PW, Determining optical properties of thin films by modified attenuated total reflection with a charge coupled device, Journal of Vacuum Science & Technology A, 6, (4) pp. 2386-2389. ISSN 0734-2101 (1988) [Refereed Article]

DOI: doi:10.1116/1.575560

Abstract

Thin films of silver produced by vacuum deposition deteriorate and tarnish when exposed to the atmosphere. This aging is due to the gradual buildup of a layer of Ag2S. When the silver layer is the plasma in an attenuated total reflection (ATR) configured waveguide the buildup of this extra layer can be observed as a shift in the angle of the resonance‐type reflection minimum. Here a modified ATR configuration which utilizes a charge coupled device has been used for accurate measurement of the angle shift of the resonance minimum.

Item Details

Item Type:Refereed Article
Research Division:Chemical Sciences
Research Group:Physical Chemistry (incl. Structural)
Research Field:Physical Chemistry not elsewhere classified
Objective Division:Expanding Knowledge
Objective Group:Expanding Knowledge
Objective Field:Expanding Knowledge in the Physical Sciences
UTAS Author:Wilson, PW (Professor Peter Wilson)
ID Code:99973
Year Published:1988
Web of Science® Times Cited:14
Deposited By:Faculty of Health
Deposited On:2015-04-22
Last Modified:2015-04-22
Downloads:0

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