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Elemental X-ray imaging using the Maia detector array: The benefits and challenges of large solid-angle

Citation

Ryan, CG and Kirkham, R and Hough, RM and Moorhead, G and Siddons, DP and de Jonge, MD and Paterson, DJ and De Geronimo, G and Howard, DL and Cleverley, JS, Elemental X-ray imaging using the Maia detector array: The benefits and challenges of large solid-angle, Nuclear Instruments & Methods in Physics Research Section A-Accelerators Spectrometers Detectors and Associated Equipment, 619, (1-3) pp. 37-43. ISSN 0168-9002 (2010) [Refereed Article]

DOI: doi:10.1016/j.nima.2009.11.035

Abstract

The fundamental parameter method for quantitative SXRF and PIXE analysis and imaging using the dynamic analysis method is extended to model the changing X-ray yields and detector sensitivity with angle across large detector arrays. The method is implemented in the GeoPIXE software and applied to cope with the large solid-angle of the new Maia 384 detector array and its 96 detector prototype developed by CSIRO and BNL for SXRF imaging applications at the Australian and NSLS synchrotrons. Peak-to-background is controlled by mitigating charge-sharing between detectors through careful optimization of a patterned molybdenum absorber mask. A geological application demonstrates the capability of the method to produce high definition elemental images up to not, vert, similar100 M pixels in size.

Item Details

Item Type:Refereed Article
Keywords:SXRF; PIXE; Dynamic analysis; X-ray microprobe; Silicon detector; Trace element imaging; Fundamental parameter method
Research Division:Physical Sciences
Research Group:Other Physical Sciences
Research Field:Synchrotrons; Accelerators; Instruments and Techniques
Objective Division:Expanding Knowledge
Objective Group:Expanding Knowledge
Objective Field:Expanding Knowledge in the Physical Sciences
ID Code:70472
Year Published:2010
Web of Science® Times Cited:83
Deposited By:Research Division
Deposited On:2011-06-23
Last Modified:2011-10-29
Downloads:0

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