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Coincident detection approach based on scale-invariance characteristic of scattering locations in wavelet-based range-scale domain

Citation

Le, TT and Nguyen, DT, Coincident detection approach based on scale-invariance characteristic of scattering locations in wavelet-based range-scale domain, Electronics Letters, 34, (17) pp. 1691-1693. ISSN 0013-5194 (1998) [Refereed Article]

DOI: doi:10.1049/el:19981169

Abstract

A coincident detection approach based on the scale-invariance characteristic of scattering locations in the range-scale domain of the wavelet transform for stepped-frequency backscattered data is presented. It is an efficient and robust approach for the extraction of scattering centres in multi-resolution range profiles.

Item Details

Item Type:Refereed Article
Research Division:Engineering
Research Group:Electrical and Electronic Engineering
Research Field:Control Systems, Robotics and Automation
Objective Division:Expanding Knowledge
Objective Group:Expanding Knowledge
Objective Field:Expanding Knowledge in Philosophy and Religious Studies
Author:Le, TT (Mr Tien Le)
Author:Nguyen, DT (Professor Thong Nguyen)
ID Code:15547
Year Published:1998
Deposited By:Electrical Engineering
Deposited On:1998-08-01
Last Modified:2011-08-10
Downloads:0

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