File(s) not publicly available
Coincident detection approach based on scale-invariance characteristic of scattering locations in wavelet-based range-scale domain
journal contribution
posted on 2023-05-16, 11:30 authored by Le, TT, Nguyen, TA coincident detection approach based on the scale-invariance characteristic of scattering locations in the range-scale domain of the wavelet transform for stepped-frequency backscattered data is presented. It is an efficient and robust approach for the extraction of scattering centres in multi-resolution range profiles.
History
Publication title
Electronics LettersVolume
34Issue
17Pagination
1691-1693ISSN
0013-5194Department/School
School of EngineeringPublisher
The Institution of Electrical EngineersPlace of publication
UKRepository Status
- Restricted