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Coincident detection approach based on scale-invariance characteristic of scattering locations in wavelet-based range-scale domain

journal contribution
posted on 2023-05-16, 11:30 authored by Le, TT, Nguyen, T
A coincident detection approach based on the scale-invariance characteristic of scattering locations in the range-scale domain of the wavelet transform for stepped-frequency backscattered data is presented. It is an efficient and robust approach for the extraction of scattering centres in multi-resolution range profiles.

History

Publication title

Electronics Letters

Volume

34

Issue

17

Pagination

1691-1693

ISSN

0013-5194

Department/School

School of Engineering

Publisher

The Institution of Electrical Engineers

Place of publication

UK

Repository Status

  • Restricted

Socio-economic Objectives

Expanding knowledge in philosophy and religious studies

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