eCite Digital Repository

A study into the impact of the choice of Maximum Power Point Tracking Technique on the reliability of the power electronics interface for photovoltaic systems

Citation

Lyden, S and Ji, T, A study into the impact of the choice of Maximum Power Point Tracking Technique on the reliability of the power electronics interface for photovoltaic systems, Proceedings from the 2020 Australasian Universities Power Engineering Conference (AUPEC), 29 November - 03 December 2020, Hobart, Tasmania, pp. 1-5. ISBN 9781922352767 (2020) [Refereed Conference Paper]


Preview
PDF
Available from 03 December 2022
215Kb
  

Copyright Statement

Copyright 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

Official URL: https://ieeexplore.ieee.org/document/9344499

Abstract

Photovoltaic (PV) systems are becoming increasingly common as residential distributed generators, however these systems can be severely limited by the presence of partial shading conditions (PSC). When bypass diodes are installed in the system to mitigate the impact of PSC, the Power-Voltage (P-V) characteristics become more complex and multiple maxima are observed. This has necessitated the development of advanced Maximum Power Point Tracking (MPPT) techniques. Advanced MPPT techniques can increase power capture under PSC, however their impact on the reliability of power electronics interfaces is not yet fully understood. This paper will present a preliminary study into the reliability implications of the choice of MPPT method on diodes in a power electronics interface. The preliminary results indicate that the choice of MPPT method may affect the reliability of the power electronics interface as evidenced through large changes in the simulated junction temperature of the diode due to power losses.

Item Details

Item Type:Refereed Conference Paper
Keywords:MPPT, photovoltaic, reliability
Research Division:Engineering
Research Group:Electrical engineering
Research Field:Photovoltaic power systems
Objective Division:Energy
Objective Group:Renewable energy
Objective Field:Solar-photovoltaic energy
UTAS Author:Lyden, S (Dr Sarah Lyden)
UTAS Author:Ji, T (Miss Tianqi Ji)
ID Code:143104
Year Published:2020
Deposited By:Engineering
Deposited On:2021-02-26
Last Modified:2021-04-07
Downloads:0

Repository Staff Only: item control page