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Interrogation of alumina grain boundaries using atomic force microscopy


Tibble, PA and Heywood, BR and Richardson, R and Barnes, P, Interrogation of alumina grain boundaries using atomic force microscopy, Proceedings of the Materials Research Society Symposium Fall 1999, 29 November - 3 December 1999, Boston, Massachusetts, pp. 207-212. (1999) [Refereed Conference Paper]

DOI: doi:10.1557/PROC-580-207


A number of MgO doped (3wt%) polycrystalline alumina samples were prepared. The preparation of these samples varied; different regimes for annealing (1500-1600 °C) and a range of dwell times were examined. Atomic force microscopy (AFM) was used to study surface features. Information on grain boundary dimensions (depth, width) is presented along with a study of grain particle size. The growth of the grain boundaries was found to contradict Mullins' theory of uniform growth with time. We also present evidence for Ostwalds' ripening and the preferential growth of [001] oriented grains.

Item Details

Item Type:Refereed Conference Paper
Research Division:Chemical Sciences
Research Group:Macromolecular and materials chemistry
Research Field:Nanochemistry
Objective Division:Expanding Knowledge
Objective Group:Expanding knowledge
Objective Field:Expanding knowledge in the chemical sciences
UTAS Author:Heywood, BR (Professor Brigid Heywood)
ID Code:104524
Year Published:1999
Deposited By:Research Division
Deposited On:2015-11-13
Last Modified:2015-11-13

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