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Interrogation of alumina grain boundaries using atomic force microscopy
conference contribution
posted on 2023-05-23, 10:33 authored by Tibble, PA, Heywood, BR, Richardson, R, Barnes, PA number of MgO doped (3wt%) polycrystalline alumina samples were prepared. The preparation of these samples varied; different regimes for annealing (1500-1600 °C) and a range of dwell times were examined. Atomic force microscopy (AFM) was used to study surface features. Information on grain boundary dimensions (depth, width) is presented along with a study of grain particle size. The growth of the grain boundaries was found to contradict Mullins' theory of uniform growth with time. We also present evidence for Ostwalds' ripening and the preferential growth of [001] oriented grains.
History
Publication title
Proceedings of the Materials Research Society Symposium Fall 1999Volume
580Editors
A Gonis, PEA Turchi, AJ ArdellPagination
207-212Publisher
Materials Research Society/Cambridge University PressPlace of publication
USAEvent title
Materials Research Society Symposium Fall 1999Event Venue
Boston, MassachusettsDate of Event (Start Date)
1999-11-29Date of Event (End Date)
1999-12-03Repository Status
- Restricted