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Reversible electrowetting on superhydrophobic double-nanotextured surfaces

Citation

Lapierre, F and Thomy, V and Coffinier, Y and Blossey, R and Boukheroub, R, Reversible electrowetting on superhydrophobic double-nanotextured surfaces, Langmuir, 25, (11) pp. 6551-6558. ISSN 0743-7463 (2009) [Refereed Article]

Copyright Statement

Copyright 2009 American Chemical Society

DOI: doi:10.1021/la803756f

Abstract

The paper reports on wetting, electrowetting (EW), and systematic contact angle hysteresis measurements after electrowetting of superhydrophobic silicon nanowire surfaces (NWs). The surfaces consist of C4F8-coated silicon nanowires grown on Si/SiO2 substrate. Different surfaces modulating (i) the dielectric layer thickness and (ii) the nanotexturation were investigated in this study. It was found that the superhydrophobic NWs display different EW behaviors according to their double nanotexturation with varying droplet impalement levels. Some surfaces exhibited a total reversibility to EW with no impalement (contact angle variation of 35 2 at 190 VTRMS with deionized water), whereas other surfaces showed nonreversible behavior to EW with partial droplet impalement. A scenario is proposed to explain the unique properties of these surfaces.

Item Details

Item Type:Refereed Article
Research Division:Engineering
Research Group:Interdisciplinary Engineering
Research Field:Fluidisation and Fluid Mechanics
Objective Division:Manufacturing
Objective Group:Instrumentation
Objective Field:Scientific Instruments
Author:Lapierre, F (Dr Florian Lapierre)
ID Code:100002
Year Published:2009
Web of Science® Times Cited:43
Deposited By:Austn Centre for Research in Separation Science
Deposited On:2015-04-22
Last Modified:2015-08-19
Downloads:0

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